RMF2012 Abstracts

Session: Wednesday 4th July PM (14.15 - 15.30)

Title: Modelling Paradata (Survey Process Data)

Name: Peter Smith

Affiliation: University of Southampton


Abstract Details

The term "paradata" is used to describe empirical measurements about the process generating survey data. Paradata can be call records or administrative records external to the actual survey data, such as information about the data collection process, visual observations of interviewers or information on interviewers. Increasingly, survey methodologists are using paradata to provide insights into survey nonresponse and measurement errors. The recent developments in the area of paradata have raised issues on how best to model such data since the structure of paradata can be complex. Papers in this session will discuss challenges in the analysis and modelling of paradata.


Presentation downloads

Presenter: Frauke Kreuter

Improving process efficiency in panel surveys with paradata

Presenter: Patrick Sturgis

Interviewers, nonresponse bias and measurement error

Presenter: Rebecca Vassallo

A simulation study of the effect of sample size and level of interpenetration on inference from cross-classified multilevel logistic regression models


The level of the session is: Advanced

Presentation details

Presenter 1

Start time: 14:20

Presentation title: Multilevel model specifications for area and interviewer random effects on nonresponse for longitudinal data

Author: Ms Rebecca Vassallo

Affiliation: University of Southampton

Presenter 2

Start time: 14:35

Presentation title: Improving process efficiency in panel surveys with paradata

Author: Professor Frauke Kreuter

Affiliation: University of Maryland, Institute for Employment Research, Ludwig-Maximilians-University

Presenter 3

Start time: 14:55

Presentation title: Analysing paradata in the UK Understanding Society survey

Author: Dr Julia D'Arrigo

Affiliation: University of Southampton

Presenter 4

Start time: 15:05

Presentation title: Interviewers, nonresponse bias and measurement error

Author: Professor Patrick Sturgis

Affiliation: University of Southampton